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This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy.
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Victor Chechik
Michael Postek
Michael T. Postek
Alessandro Bencini
Allen J. Bard
Daniel J. C. Herr
Frank, J.
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Peter W. Hawkes
Steven D. Schwartzbach
National Research Council (U. S.) Committee on a Scientific Assessment of Free-Electron Laser Technology for Naval Applications
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Nobuo Tanaka
Frank Schellenberg
S. Amelinckx
International Conference on Infrared and Millimeter Waves (31th 2006 Shanghai, China)
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Benjamin Kazan
Peter W. Hawkes
Zbigniew Zimek
Tom Mulvey
Estela Castillo de Maruenda
Peter W. Hawkes
Colm T. Whelan
P. M. Solozhenkin
Om [Ed] Johari
Zufu Zhu
Om [Ed] Johari
Fred Ramon Buskirk
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Mihai Drăgănescu
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Raymond S. Alger
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